Template:Scanning Probe Microscopy in Modern Nanotechnology (part 2)

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Friday, June 4, 8:30 AM - 12:00 PM

Scanning Probe Microscopy in Modern Nanotechnology
Kellas 101

Organizer/Presider: Igor Sokolov

8:30 Introductory Remarks

8:35      Sample-Independent Lateral Force Calibration. E. Anderson1, T. Esformes1, and N.A. Burnham1, Department of Physics, Worcester Polytechnic Institute, Worcester MA 01609

9:05 300 AFM-Based Scanning Mirowave Microscopy and Its Application to Studies of Metal-Insulator Transition in VO2. Alexander Tselev, Oak Ridge National Laboratory

9:45 301 Peak Force Tapping & Quantitative Mechanical Mapping with Single Molecule Resolution. John Thornton, Veeco Instruments

10:25 Intermission

10:40 302 AFM To Study Electron Photoemission from Single Quantum Dots for Solar Cells and Memory Applications. Nataliia Guz, Maxim Dokukin and Igor Sokolov, Clarkson University

11:00 303 Which Fractal Parameter Most Determines Adhesion?. Nancy A. Burnham1, Deli Liu1 and Jack Martin2, (1)Worcester Polytechnic Institute, (2)Analog Devices Inc

11:40 304 Atomic Force Microscopy To Detect Internal Live Processes in Insects. Maxim Dokukin1, Nataliia Guz1, Sergey Vasilyev1 and Igor Sokolov1,2, (1)Clarkson University, (2)Clarkson University

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